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Proceedings Paper

Application of numerical methods at research of heterogeneous x-rays influence for diffraction line width
Author(s): V. V. Korchevskii; S. I. Klepikov; L. M. Popova
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Paper Abstract

Numerical methods have been applied for the estimation of a hardware error of x-ray methods caused heterogeeous characteristic x-rays. It is received, that this error depends on a corner of reflection, number of planes of reflection and wavelength. Dependences of diffraction line broadening owing to nonmonochromaticity from these parameters are resulted.

Paper Details

Date Published: 8 June 2005
PDF: 4 pages
Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.634055
Show Author Affiliations
V. V. Korchevskii, Khabarovsk State Univ. of Technology (Russia)
S. I. Klepikov, Khabarovsk State Univ. of Technology (Russia)
L. M. Popova, Khabarovsk State Univ. of Technology (Russia)


Published in SPIE Proceedings Vol. 5851:
Fundamental Problems of Optoelectronics and Microelectronics II
Yuri N. Kulchin; Oleg B. Vitrik; Vladimir I. Stroganov, Editor(s)

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