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Proceedings Paper

New generation holographic measurement system for industrial nondestructive testing
Author(s): V. S. Gurevich; M. E. Gusev; V. I. Redkorechev; V. E. Gaponov; I. V. Alexeseenko; A. M. Isaev; A. N. Malov; Yu. N. Zaharov
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Paper Abstract

Advanced achievements in holographic and speckle interferometry, physics of solid-state lasers, digital recording and image processing have created real precondistions for a rising of holographic methods of diagnostics to qualitatively new level. In the present work the general concept of universal holographic system for nondestructive researches in industrial environment is considered and results of tests of some units of this equipment are presented.

Paper Details

Date Published: 8 June 2005
PDF: 8 pages
Proc. SPIE 5851, Fundamental Problems of Optoelectronics and Microelectronics II, (8 June 2005); doi: 10.1117/12.633907
Show Author Affiliations
V. S. Gurevich, AlmaAta Laser Technology Engineering Ctr. (Kazakhstan)
M. E. Gusev, Kaliningrad State Univ. (Russia)
V. I. Redkorechev, AlmaAta Laser Technology Engineering Ctr. (Kazakhstan)
V. E. Gaponov, Kaliningrad State Univ. (Russia)
I. V. Alexeseenko, Kaliningrad State Univ. (Russia)
A. M. Isaev, AlmaAta Laser Technology Engineering Ctr. (Kazakhstan)
A. N. Malov, Irkutsk State Technical Univ. (Russia)
Yu. N. Zaharov, Univ. of Nizhny Novgorod (Russia)


Published in SPIE Proceedings Vol. 5851:
Fundamental Problems of Optoelectronics and Microelectronics II
Yuri N. Kulchin; Oleg B. Vitrik; Vladimir I. Stroganov, Editor(s)

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