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Proceedings Paper

Refractometric low coherence interferometry: dispersion interferometry
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Paper Abstract

Primarily, low-coherence interferometry yields the optical length, i. e. the product of sample length or sample depth data times the complementary sample refractive index. Each quantity, refractive index as well as sample depth can be obtained from the optical length if the complement is known. In a first step presented here, we use sample dispersion data for absolute depth or thickness measurement of dispersive samples. We shall discuss the physical implications and present preliminary results.

Paper Details

Date Published: 7 October 2005
PDF: 8 pages
Proc. SPIE 5861, Optical Coherence Tomography and Coherence Techniques II, 58610D (7 October 2005); doi: 10.1117/12.632971
Show Author Affiliations
M. Bagherzadeh, Medical Univ. Vienna (Austria)
A. F. Fercher, Medical Univ. Vienna (Austria)
M. Pircher, Medical Univ. Vienna (Austria)
W. Drexler, Medical Univ. Vienna (Austria)
C. K. Hitzenberger, Medical Univ. Vienna (Austria)

Published in SPIE Proceedings Vol. 5861:
Optical Coherence Tomography and Coherence Techniques II
Wolfgang Drexler, Editor(s)

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