Share Email Print
cover

Proceedings Paper

Contamination influence on receptacle type optical data links
Author(s): Scott Takahashi; Yutaka Sadohara; Carla Gleason; Tatiana Berdinskikh; Thomas Mitcheltree; Steve Lytle
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The paper summarizes the research of the iNEMI (International Manufacturing Initiatives) project on Fiber Connector Endface Specifications focused on the development of the cleanliness specification of the receptacle modules. It will discuss (1) the critical parameters of Small Form-Factor (SFF&SFP) modules sensitive to the contamination, (2) the experimental contamination techniques, (3) the test and measurement methodology, as well as (4) the Gage R & R (Repeatability & Reproducibility) studies. We choose one of the standard OC-48, SFF modules manufactured by Sumitomo Electric as the experimental vehicle for the project. The influence of the SiO2 based dust with the particle size under 149 um on optical performance of SFF module has been investigated. The Optical Return Loss (ORL) has been identified as the most sensitive parameter to the contamination for the both transmitter and receiver optical endface. In a case of changes of the transmitter ORL by 20-25 dB due to the application of the contamination, the optical power and spectral width didn't change, and the pulse mask was reduced only by 2%. The contamination near the core area caused changes of the ORL by 20-30dB, and high standard deviation of ORL (0.5-2.1 dB). The Gage R & R study was focused on investigation of equipment repeatability, mating repeatability, and operator dependence for ORL measurement of clean and contaminated optical endface. The proposed experimental methodology was able to achieve all Gage R & R parameters within the required limits.

Paper Details

Date Published: 12 October 2005
PDF: 11 pages
Proc. SPIE 5970, Photonic Applications in Devices and Communication Systems, 597004 (12 October 2005); doi: 10.1117/12.632205
Show Author Affiliations
Scott Takahashi, Sumitomo Electric Industries Ltd. (Japan)
Yutaka Sadohara, Sumitomo Electric Industries Ltd. (Japan)
Carla Gleason, Excelight Communications Inc. (United States)
Tatiana Berdinskikh, Celestica International Inc. (Canada)
Thomas Mitcheltree, Cisco Systems Inc. (United States)
Steve Lytle, Westover Scientific Inc. (United States)


Published in SPIE Proceedings Vol. 5970:
Photonic Applications in Devices and Communication Systems
Peter Mascher; John C. Cartledge; Andrew Peter Knights; David V. Plant, Editor(s)

© SPIE. Terms of Use
Back to Top