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Proceedings Paper

Scaling of the microwave and dc conductance of metallic single-walled carbon nanotubes
Author(s): Zhen Yu; Chris Rutherglen; Peter J. Burke
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Paper Abstract

We measure the dynamical conductance of electrically contacted single-walled carbon nanotubes at dc and ac as a function of source-drain voltage in both low and high dc bias voltage. We show a direct relationship between the ac conductance and dc conductance. We also measure the microwave conductance of 2 nanotubes in parallel and observe an anomalous frequency dependence.

Paper Details

Date Published: 12 November 2005
PDF: 7 pages
Proc. SPIE 6003, Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems, 60030Q (12 November 2005); doi: 10.1117/12.631867
Show Author Affiliations
Zhen Yu, Univ. of California, Irvine (United States)
Chris Rutherglen, Univ. of California, Irvine (United States)
Peter J. Burke, Univ. of California, Irvine (United States)


Published in SPIE Proceedings Vol. 6003:
Nanostructure Integration Techniques for Manufacturable Devices, Circuits, and Systems: Interfaces, Interconnects, and Nanosystems
Minoru M. Freund; M. Saif Islam; Achyut K. Dutta, Editor(s)

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