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Proceedings Paper

Receiver sensitivity improvement using polarization insensitive semiconductor optical amplifier
Author(s): Surinder Singh; R. S. Kaler
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Paper Abstract

In this paper, we investigate a SOA (semiconductor optical amplifier) preamplifier model by suitable choosing the material and device parameters for the SOA to reduce the amplified spontaneous emission (ASE) noise at low range of 22.3 μW with 0.1 mW input power for PIN receiver. Our proposed SOA optical preamplifier is found to be more relaxed from optical alignment & antireflection coating and eliminate the need of optical filter and give large tolerance of an input light wavelength more than 100 nm. Also we investigate the receiver sensitivity for different bit rate. We show that receiver sensitivity is -69.9 dBm at bit error rate (BER) of 4.6×10-10 for 10 Gb/s and for the 40 Gb/s bit rate the improved receiver sensitivity is -19.2 dBm with PIN receiver. We also observe the sensitivity of -40.5 dBm at 40 Gb/s with DPSK (differential phase shift keying) receiver. Further the impact of amplified spontaneous emission power, gain variation with input light wavelength & optical gain for TE & TM modes with input power for PIN & DPSK receivers has been illustrated. We show that optical gain of SOA is polarization independent and remain constant 30.06 dB up to gain saturation. We also show that DPSK receiver suffer less from ASE noise. The variation of material loss, length & bias current for our SOA preamplifier to optimize the receiver sensitivity is further illustrated.

Paper Details

Date Published: 25 October 2005
PDF: 12 pages
Proc. SPIE 6014, Active and Passive Optical Components for WDM Communications V, 601418 (25 October 2005); doi: 10.1117/12.631507
Show Author Affiliations
Surinder Singh, Giani Zail Singh College of Engineering and Technology (India)
R. S. Kaler, Thapar Institute of Engineering and Technology (India)


Published in SPIE Proceedings Vol. 6014:
Active and Passive Optical Components for WDM Communications V
Achyut K. Dutta; Yasutake Ohishi; Niloy K. Dutta; Jesper Moerk, Editor(s)

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