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Proceedings Paper

Sub-pixel accuracy thickness calculation of poultry fillets from scattered laser profiles
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Paper Abstract

A laser range imaging system based on the triangulation method was designed and implemented for online high-resolution thickness calculation of poultry fillets. A laser pattern was projected onto the surface of the chicken fillet for calculation of the thickness of the meat. Because chicken fillets are relatively loosely-structured material, a laser light easily penetrates the meat, and scattering occurs both at and under the surface. When laser light is scattered under the surface it is reflected back and further blurs the laser line sharpness. To accurately calculate the thickness of the object, the light transportation has to be considered. In the system, the Bidirectional Reflectance Distribution Function (BSSRDF) was used to model the light transportation and the light pattern reflected into the cameras. BSSRDF gives the reflectance of a target as a function of illumination geometry and viewing geometry. Based on this function, an empirical method has been developed and it has been proven that this method can be used to accurately calculate the thickness of the object from a scattered laser profile. The laser range system is designed as a sub-system that complements the X-ray bone inspection system for non-invasive detection of hazardous materials in boneless poultry meat with irregular thickness.

Paper Details

Date Published: 7 November 2005
PDF: 9 pages
Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000K (7 November 2005); doi: 10.1117/12.631028
Show Author Affiliations
Hansong Jing, Univ. of Maryland, College Park (United States)
Xin Chen, Univ. of Maryland, College Park (United States)
Yang Tao, Univ. of Maryland, College Park (United States)
Bin Zhu, Univ. of Maryland, College Park (United States)
Fenghua Jin, Univ. of Maryland, College Park (United States)


Published in SPIE Proceedings Vol. 6000:
Two- and Three-Dimensional Methods for Inspection and Metrology III
Kevin G. Harding, Editor(s)

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