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Proceedings Paper

Nondestructive determination of soluble solids in chufa by FT-near infrared (FT-NIR) spectroscopy
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Paper Abstract

The near infrared (NIR) method based on fibre-optic FT-NIR spectrometer was tested to determine soluble solids content (SSC) non-destructively in chufa (Eleocharis tuberose schult). A total of 240 chufas (120 of cv. 'Jinhua' and 120 of cv. 'Yongkang') sampled from eight positions in the different fields to increase variation in soluble solids content, were measured after 2-days storage and the measurements randomly assigned to a calibration data set and a prediction data set. Thus the calibration set and the prediction set represented exactly the same distribution. The calibration data set was used to select the wavelengths best correlated with Brix and different regression methods (partial least squares (PLS) regression and multiple linear regression (MLR)) that was applied to calculate the Brix value in the prediction data set. The most significant r (0.9056) was found with the first derivative of log (1/R) (where R reflectance), yielding standard error of calibration (SEC)=0.545 Brix, standard error of prediction (SEP)=0.632 Brix. Analysis of different methods performed on the actual and the predicted Brix showed PLS is better than MLR. This NIR method seems reliable for determining soluble solids contents of chufa non-destructively, and could prove useful for it.

Paper Details

Date Published: 8 November 2005
PDF: 10 pages
Proc. SPIE 5996, Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality, 59961G (8 November 2005); doi: 10.1117/12.630963
Show Author Affiliations
Guang Ma, Zhejiang Univ. (China)
Jinhua College of Profession and Technology (China)
Yibin Ying, Zhejiang Univ. (China)
Huishan Lu, Zhejiang Univ. (China)
Xiaping Fu, Zhejiang Univ. (China)
Haiyan Yu, Zhejiang Univ. (China)
Yande Liu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 5996:
Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality
Yud-Ren Chen; George E. Meyer; Shu-I Tu, Editor(s)

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