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Proceedings Paper

Readout integrated circuit for microbolometer with an analog non-uniformity correction
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Paper Abstract

We have developed a microbolometer readout integrated circuit (ROIC) that corrects the non-uniformity in analog operation and acts in both normal mode and edge detection mode. A capacitive transimpedance amplifier (CTIA) has been employed as the input circuit of the microbolometer. Generally, when fabricating microbolometer focal plane arrays (FPAs), offset-error and gain-error in the inter-microbolometer are induced by fabrication error. They are shown as fixed pattern noise (FPN) in the infrared image. In the present study, a circuit correcting the offset-error and the gain-error in the normal mode by controlling the bias and the integration capacitance of the CTIA is proposed. This circuit does not require an additional DSP chip, and the non-uniformity is corrected before the analog to digital conversion (ADC). Thus, it can utilize 3-4 bits lower ADC compared to the conventional readout circuit. In the edge detection mode, after correcting the gain-error in two adjacent pixels, edge detection can be realized by subtracting their signal without the DSP. We have designed the suggested circuit to output a 10bit level effective infrared signal using 0.35um 2-poly 3-metal CMOS technology.

Paper Details

Date Published: 12 October 2005
PDF: 8 pages
Proc. SPIE 5987, Electro-Optical and Infrared Systems: Technology and Applications II, 59870P (12 October 2005); doi: 10.1117/12.630755
Show Author Affiliations
C. H. Hwang, Korea Advanced Institute of Science and Technology (South Korea)
D. H. Woo, Korea Advanced Institute of Science and Technology (South Korea)
Y. S. Lee, Korea Advanced Institute of Science and Technology (South Korea)
H. C. Lee, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 5987:
Electro-Optical and Infrared Systems: Technology and Applications II
Ronald G. Driggers; David A. Huckridge, Editor(s)

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