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Proceedings Paper

Integrated quality assurance for assembly and testing of complex structures
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Paper Abstract

Modern production processes are directed by properties of the components to be manufactured. These components have different sizes, functionalities, high assembly complexity and high security requirements. The increasing requirements during the manufacturing of complex products like cars and aircrafts demand new solutions for the quality assurance - especially for the production at different places. The main focus is to find a measurement strategy that is cost effective, flexible and adaptive. That means a clear definition of the measurement problem, the measurement with adapted resolution, the data preparation and evaluation and support during measurement and utilisation of the results directly in the production. In this paper we describe flexible measurement devices on example of three different techniques: fringe projection, fringe reflection and shearography. These techniques allow the detection of surface and subsurface defects like bumps, dents and delaminations with high resolution. The defects can be optically mapped onto the object's surface. Results are demonstrated with big components taken from automotive and aircraft production. We will point out the most important adaptations of the systems to realize miniaturized, robust and mobile devices for the quality assurance in an industrial environment. Additionally the implementation into a Mobile Maintenance and Control structure is demonstrated.

Paper Details

Date Published: 16 November 2005
PDF: 12 pages
Proc. SPIE 5999, Intelligent Systems in Design and Manufacturing VI, 59990L (16 November 2005); doi: 10.1117/12.630726
Show Author Affiliations
Christoph von Kopylow, Bremer Institut für Angewandte Strahltechnik (Germany)
Thorsten Bothe, Bremer Institut für Angewandte Strahltechnik (Germany)
Frank Elandaloussi, Bremer Institut für Angewandte Strahltechnik (Germany)
Michael K. Kalms, Bremer Institut für Angewandte Strahltechnik (Germany)
Werner Jüptner, Bremer Institut für Angewandte Strahltechnik (Germany)


Published in SPIE Proceedings Vol. 5999:
Intelligent Systems in Design and Manufacturing VI
Bhaskaran Gopalakrishnan, Editor(s)

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