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Proceedings Paper

Study of deacetylation in chitinous materials using near infrared spectroscopy
Author(s): Suming Chen; Chih-Cheng Tsai; Richie L. C. Chen; I-Chang Yang; Hsien-Yi Hsiao; Chia-Tseng Chen; Ci-Wen Yang
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Paper Abstract

Chitinous materials are important sources for bio-medical applications, and the process monitoring is one of key factors for the quality control of products. In this study, chitin and chitosan in suspension form were analyzed using near infrared (NIR) spectroscopy. Two models including multiple linear regression (MLR), modified partial least square regression (MPLSR) were adopted for studying the degree of deacetylation (DD) of chitinous materials in order to assure a better quality monitoring and control for chitosan production. During the process of the deacetylation, the real-time measurements of suspension were conducted. The MPLSR model with second derivative spectra in the range of 600-1000 and 1400-1500 nm yielded the best results, which were rc=0.991, SEC=0.019, RESC=1.4%, rp=0.990, SEP=0.022, RSEP=3.4%, RPD=9.4. The NIR measurements of DD status of chitinous suspension could be achieved by using the MLR and MPLSR models developed in this study. It provides great application potentials to the real-time and on-line quality monitoring of deacetylation process for the production of chitosan.

Paper Details

Date Published: 9 November 2005
PDF: 8 pages
Proc. SPIE 5996, Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality, 599611 (9 November 2005); doi: 10.1117/12.630535
Show Author Affiliations
Suming Chen, National Taiwan Univ. (Taiwan)
Chih-Cheng Tsai, National Taiwan Univ. (Taiwan)
Richie L. C. Chen, National Taiwan Univ. (Taiwan)
I-Chang Yang, National Taiwan Univ. (Taiwan)
Hsien-Yi Hsiao, National Taiwan Univ. (Taiwan)
Chia-Tseng Chen, National Taiwan Univ. (Taiwan)
Ci-Wen Yang, National Taiwan Univ. (Taiwan)


Published in SPIE Proceedings Vol. 5996:
Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality
Yud-Ren Chen; George E. Meyer; Shu-I Tu, Editor(s)

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