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Proceedings Paper

3D measurements using a programmable projector and a grating
Author(s): Kevin Harding; Russ Demuth; Robert Tait
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Paper Abstract

Pattern projection using physical gratings or interference effects has successfully been used to perform 3D measurements of parts. However, such systems lack the flexibility to adjust light levels over the area illuminated, leaving some areas too dark or too light to measure, or the ability to mask out parts of the illumination field, often creating spurious reflections and noise from areas not of interest. LCD/DMD digital projection systems have been used to create flexible projection of patterns, but they are limited in their resolution and ability to accurately reconstruct a smooth light pattern such as a sine wave, creating more a binarized approximation. This paper describes a method that combines together a computer-interfaced projector, such as an LCD or DMD based projector, with a high-resolution pattern projection system. The result is a system that has high depth resolution, but with the added flexibility of a programmable light source to control light levels and areas of illumination. This paper will discuss the pros and cons of this method, and suggest ways this approach might be applied to difficult part measurement problems.

Paper Details

Date Published: 7 November 2005
PDF: 7 pages
Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000C (7 November 2005); doi: 10.1117/12.630083
Show Author Affiliations
Kevin Harding, General Electric Global Research (United States)
Russ Demuth, General Electric Global Research (United States)
Robert Tait, General Electric Global Research (United States)


Published in SPIE Proceedings Vol. 6000:
Two- and Three-Dimensional Methods for Inspection and Metrology III
Kevin G. Harding, Editor(s)

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