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Proceedings Paper

Shiny parts measurement using color separation
Author(s): Qingying Hu; Kevin G. Harding; Xiaoming Du; Don Hamilton
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Paper Abstract

In manufacturing, inspection and measurement systems have long been desired to be able to measure as many kinds of parts as possible without treating the surface. Specifically, measuring shiny parts has been a big challenge for optical metrology because of double-bounced light -- a phenomenon that light can be reflected from an area to another on the surface. The unwanted light will result in higher noise and can even make the measured results unacceptable. Traditionally, a polarizer is placed in front of both the light sources and the camera. After properly adjusting the polarizer in front of the camera, the double bounced reflected light can be blocked to some degree while the normally reflected light can go through. By this way, the extra reflections can be reduced but not totally eliminated. This paper presents a new method to totally eliminate double bounced light. Here, color light sources are used to illuminate the part and multiple cameras are used to measure different areas. Each camera views through an appropriate color filter so that only a certain color light is seen. The measured results from all cameras are then merged together to create the complete image. This method is more efficient than the traditional solution that uses polarizers. Both measurement principle and some results are given.

Paper Details

Date Published: 7 November 2005
PDF: 8 pages
Proc. SPIE 6000, Two- and Three-Dimensional Methods for Inspection and Metrology III, 60000D (7 November 2005); doi: 10.1117/12.629942
Show Author Affiliations
Qingying Hu, Applied Optics Lab., GE Global Research (United States)
Kevin G. Harding, Applied Optics Lab., GE Global Research (United States)
Xiaoming Du, Digital Manufacturing Lab., GE Global Research (China)
Don Hamilton, Visualization and Computer Vision Lab., GE Global Research (United States)

Published in SPIE Proceedings Vol. 6000:
Two- and Three-Dimensional Methods for Inspection and Metrology III
Kevin G. Harding, Editor(s)

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