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Proceedings Paper

Analysis of web defects by correlating 1-D Morlet and 2-D Mexican hat wavelet transforms
Author(s): Jacques Lewalle; D. Steven Keller
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Paper Abstract

The manufacturing processes for paper and similar non-woven fiber webs can affect end-use properties. In this paper, we document a new wavelet-based method of product diagnostic. The methods combines 1-dimensional Morlet and isotropic 2-dimensional Mexican hat wavelets, with wavelet-based filtering and denoising techniques. Two samples produced in pilot machines by different forming methods are examined for variations in their mass per unit area - the grammage. The grammage maps are decomposed into three layers: one associated with the nearly-periodic grammage streaks at large scale, one associated with flocs or related medium-size structures, and the background which combines pixel-size fluctuations and large-scale stochastic modulations. By correlating the structure and background fluctuations with the streaks local phase, we show that one sample exhibits formation streaks (statistical variations in properties other than mean grammage), which are not found in the other.

Paper Details

Date Published: 7 November 2005
PDF: 12 pages
Proc. SPIE 6001, Wavelet Applications in Industrial Processing III, 600109 (7 November 2005); doi: 10.1117/12.629908
Show Author Affiliations
Jacques Lewalle, Syracuse Univ. (United States)
D. Steven Keller, State Univ. of New York (United States)


Published in SPIE Proceedings Vol. 6001:
Wavelet Applications in Industrial Processing III
Frederic Truchetet; Olivier Laligant, Editor(s)

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