Share Email Print
cover

Proceedings Paper

Design of readout circuit with noise tolerant edge detection for InSb MWIR detector
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

In this paper, a readout circuit (ROIC) utilizing a novel noise tolerant edge detection technique for InSb medium wavelength infrared focal plane arrays (MWIR FPAs) is studied. The use of a noise tolerant edge detection algorithm eliminates the need for a pixel-level non-uniformity correction circuit. In addition, the proposed circuit's simple structure allows the processing circuits to be integrated within a shared 2 by 2 pixel area. The proposed method shows better performance for the Gaussian and salt & pepper noise than other conventional approaches. A good edge map is obtained in general InSb MWIR detectors which have 99.5% operability and about 5% non-uniformity of the pixel current. Basic operation of the fabricated noise tolerant edge detection circuit is demonstrated.

Paper Details

Date Published: 11 October 2005
PDF: 9 pages
Proc. SPIE 5987, Electro-Optical and Infrared Systems: Technology and Applications II, 59870O (11 October 2005); doi: 10.1117/12.629648
Show Author Affiliations
Chul Bum Kim, Korea Advanced Institute of Science and Technology (South Korea)
Doo Hyung Woo, Korea Advanced Institute of Science and Technology (South Korea)
Yong Soo Lee, Korea Advanced Institute of Science and Technology (South Korea)
Hee Chul Lee, Korea Advanced Institute of Science and Technology (South Korea)


Published in SPIE Proceedings Vol. 5987:
Electro-Optical and Infrared Systems: Technology and Applications II
Ronald G. Driggers; David A. Huckridge, Editor(s)

© SPIE. Terms of Use
Back to Top