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Proceedings Paper

A new wavelet sub-band characterization for texture recognition
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Paper Abstract

Our article presents a new way to characterize texture : Wavelet Geometrical Features, that extracts structural measurements from wavelet sub-bands, when most of the wavelet-based methods found in the litterature use only statistical ones. We first describe the method used to compute our features, and thereafter compare them to thirteen other standard texture features in a classification experiment on the whole Brodatz texture database. We showed that our method produces the best results, especially over the wavelet energy signature and the method it originated from, the Statistical Geometrical Features of Chen.

Paper Details

Date Published: 8 November 2005
PDF: 8 pages
Proc. SPIE 6001, Wavelet Applications in Industrial Processing III, 60010A (8 November 2005); doi: 10.1117/12.629333
Show Author Affiliations
François Mourougaya, Univ. de Poitiers (France)
Philippe Carré, Univ. de Poitiers (France)
Christine Fernandez-Maloigne, Univ. de Poitiers (France)


Published in SPIE Proceedings Vol. 6001:
Wavelet Applications in Industrial Processing III
Frederic Truchetet; Olivier Laligant, Editor(s)

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