Share Email Print
cover

Proceedings Paper

Z-scan characterization of the nonlinear refractive index of single crystal ZnSe in the 1.20-1.95 µm wavelength range
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The nonlinear refractive index, n2, of single crystal ZnSe was characterized in the 1200-1950 nm wavelength region using the z-scan technique with picosecond pulses provided by a widely tunable traveling-wave optical parametric amplifier. We have found that the n2 values range from ~15.8×10-6 to ~9.3×10-6 cm2/GW. The measured spectrum and scaling of the nonlinear refractive index complements previously reported values at shorter wavelengths, and is in good agreement with a theoretical model based on the nonlinear Kramers-Kroenig transformation.

Paper Details

Date Published: 30 September 2005
PDF: 8 pages
Proc. SPIE 5971, Photonic Applications in Nonlinear Optics, Nanophotonics, and Microwave Photonics, 59710H (30 September 2005); doi: 10.1117/12.628686
Show Author Affiliations
Arkady Major, Univ. of Toronto (Canada)
J. Stewart Aitchison, Univ. of Toronto (Canada)
Peter W. E. Smith, Univ. of Toronto (Canada)
Evgeni Sorokin, Technische Univ. Wien (Austria)
Irina T. Sorokina, Technische Univ. Wien (Austria)


Published in SPIE Proceedings Vol. 5971:
Photonic Applications in Nonlinear Optics, Nanophotonics, and Microwave Photonics
Roberto A. Morandotti; Harry E. Ruda; Jianping Yao, Editor(s)

© SPIE. Terms of Use
Back to Top