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Proceedings Paper

Optoelectronic device for the measurement of the absolute linear position in the micrometric displacement range
Author(s): Tomas Morlanes; Jose Luis de la Pena; Luis Miguel Sanchez-Brea; Jose Alonso; Daniel Crespo; Jose Bienvenido Saez-Landete; Eusebio Bernabeu
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Paper Abstract

In this work, an optoelectronic device that provides the absolute position of a measurement element with respect to a pattern scale upon switch-on is presented. That means that there is not a need to perform any kind of transversal displacement after the startup of the system. The optoelectronic device is based on the process of light propagation passing through a slit. A light source with a definite size guarantees the relation of distances between the different elements that constitute our system and allows getting a particular optical intensity profile that can be measured by an electronic post-processing device providing the absolute location of the system with a resolution of 1 micron. The accuracy of this measuring device is restricted to the same limitations of any incremental position optical encoder.

Paper Details

Date Published: 7 July 2005
PDF: 9 pages
Proc. SPIE 5840, Photonic Materials, Devices, and Applications, (7 July 2005); doi: 10.1117/12.628135
Show Author Affiliations
Tomas Morlanes, Fagor Automation S. Coop. (Spain)
Jose Luis de la Pena, Fagor Automation S. Coop. (Spain)
Luis Miguel Sanchez-Brea, Univ. Complutense de Madrid (Spain)
Jose Alonso, Univ. Complutense de Madrid (Spain)
Daniel Crespo, Univ. Complutense de Madrid (Spain)
Jose Bienvenido Saez-Landete, Univ. de Alcala (Spain)
Eusebio Bernabeu, Univ. Complutense de Madrid (Spain)


Published in SPIE Proceedings Vol. 5840:
Photonic Materials, Devices, and Applications
Goncal Badenes; Derek Abbott; Ali Serpenguzel, Editor(s)

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