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Proceedings Paper

The synergy of the MISR cloud masks for global cloud climatology
Author(s): Iliana Genkova; Mike Wilson; Yuekui Yang; Guangyu Zhao; Bill Chapman; Eric Snodgrass; Dominic Mazzoni; Larry Di Girolamo
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Paper Abstract

The Multi-angle Imaging SpectroRadiometer (MISR) currently provides three independently derived cloud mask products at 1.1 km spatial resolution. The Radiometric Camera-by-camera Cloud Mask (RCCM) is terrain-referenced and calculated for each of the nine MISR cameras, the Stereoscopically Derived Cloud Mask (SDCM) is feature-projected and uses radiances from one pair of the MISR cameras, and the Angular Signature Cloud Mask (ASCM) uses a band-differenced angular signature based on the two most oblique cameras viewing forward scattering radiation. While each mask has been extensively validated, each having its own strengths and weaknesses, there has been no effort to combine the strengths of all of the masks to create a single consensus product. We present an algorithm which addresses the problem and produces a so called "consensus cloud mask" of improved performance, and elaborate on further cloud climatology applications.

Paper Details

Date Published: 31 October 2005
PDF: 9 pages
Proc. SPIE 5979, Remote Sensing of Clouds and the Atmosphere X, 59790B (31 October 2005); doi: 10.1117/12.627909
Show Author Affiliations
Iliana Genkova, Univ. of Illinois at Urbana-Champaign (United States)
Mike Wilson, Univ. of Illinois at Urbana-Champaign (United States)
Yuekui Yang, Univ. of Illinois at Urbana-Champaign (United States)
Guangyu Zhao, Univ. of Illinois at Urbana-Champaign (United States)
Bill Chapman, Univ. of Illinois at Urbana-Champaign (United States)
Eric Snodgrass, Univ. of Illinois at Urbana-Champaign (United States)
Dominic Mazzoni, Jet Propulsion Lab., NASA (United States)
Larry Di Girolamo, Univ. of Illinois at Urbana-Champaign (United States)


Published in SPIE Proceedings Vol. 5979:
Remote Sensing of Clouds and the Atmosphere X
Klaus Schäfer; Adolfo T. Comerón; James R. Slusser; Richard H. Picard; Michel R. Carleer; Nicolaos Sifakis, Editor(s)

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