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Proceedings Paper

Angular dependent specular reflectance in UV/Vis/NIR
Author(s): I. Stemmler
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Paper Abstract

There are well known methods and equipments for measuring the specular (/directed) reflectance of a sample. There are quite different sample types such as laser mirrors or anti-reflectance material. Most of the common set-ups are not very flexible (e.g. only one angle ore only one wavelength), critical in accuracy, extremely expensive ore difficult to use. A new development from PerkinElmer tries to combine: high flexibility, high precision, easy to use, comparably low cost. The system is able to measure all type of samples from high reflectance to anti reflective coatings. It covers a large wavelength range of 185...3100 nm and is able to measure fully automated a couple of self-defined angles (8...68°) in S and P polarisation with only one interaction at the beginning (pressing the start button). No alignment is necessary in the daily use. The system works with an absolute measurement mode and therefore does not need any calibrated standard mirrors. The intent of this contribution is to introduce this new technology in comparison to traditional measurements.

Paper Details

Date Published: 20 October 2005
PDF: 11 pages
Proc. SPIE 5965, Optical Fabrication, Testing, and Metrology II, 59651G (20 October 2005); doi: 10.1117/12.626850
Show Author Affiliations
I. Stemmler, PerkinElmer LAS GmbH (Germany)


Published in SPIE Proceedings Vol. 5965:
Optical Fabrication, Testing, and Metrology II
Angela Duparré; Roland Geyl; Lingli Wang, Editor(s)

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