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Proceedings Paper

Integral imaging with extended depth of field
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Paper Abstract

One of the main drawbacks on integral imaging systems is their limited depth of field. With the current state of sensor technology such limitation is imposed by the pixilated structure of cell detectors. So, depth of field only can be optimized by proper selection of system parameters. However, nowadays sensor technology experiments a fast development. As a result of it, it is sure that in a close future the number of pixels per elemental image will be high enough to not influence the system resolution. In this not-too-far context, new ideas should be applied to improve the depth of field of integral imaging systems. Here we propose a new method to significantly extend the depth of field. The technique is based on the combined benefits of a proper amplitude modulation of the microlenses, and the application of deconvolution tools.

Paper Details

Date Published: 15 November 2005
PDF: 14 pages
Proc. SPIE 6016, Three-Dimensional TV, Video, and Display IV, 601602 (15 November 2005); doi: 10.1117/12.626790
Show Author Affiliations
Manuel Martínez-Corral, Univ. de Valencia (Spain)
Raúl Martínez-Cuenca, Univ. de Valencia (Spain)
Genaro Saavedra, Univ. de Valencia (Spain)
Bahram Javidi, Univ. of Connecticut (United States)

Published in SPIE Proceedings Vol. 6016:
Three-Dimensional TV, Video, and Display IV
Bahram Javidi; Fumio Okano; Jung-Young Son, Editor(s)

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