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Proceedings Paper

Restitution of the technological parameters of a 320×240 MCT LWIR focal plane array by spectrometric measurements
Author(s): Sylvain Rommeluère; Nicolas Guérineau; Joël Deschamps; Eric De Borniol; Alain Million; Jean-Paul Chamonal; Gérard Destefanis
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Paper Abstract

The evaluation of technological parameters is of primary importance for the detector industry, since it allows both to validate the fabrication process and to optimize the electro-optical characteristics of the detectors. By measuring the spectral response of detectors with a high resolution, it is possible to display specific optical effects. Using a radiometric model of the detecting architecture, we are able to understand their physical origins and to determinate some technological and optical parameters. We have developed a test bench which provides spectral responses of infrared detectors using a Fourier transform spectrometer. The principle of the test bench and the methodology used are detailed. Experimental results, as well as the associated radiometric model, are presented for a dedicated 320×240 MCT LWIR focal plane arrays (FPAs).

Paper Details

Date Published: 14 October 2005
PDF: 12 pages
Proc. SPIE 5964, Detectors and Associated Signal Processing II, 59640E (14 October 2005); doi: 10.1117/12.626301
Show Author Affiliations
Sylvain Rommeluère, ONERA (France)
Nicolas Guérineau, ONERA (France)
Joël Deschamps, ONERA (France)
Eric De Borniol, CEA/LETI (France)
Alain Million, CEA/LETI (France)
Jean-Paul Chamonal, CEA/LETI (France)
Gérard Destefanis, CEA/LETI (France)


Published in SPIE Proceedings Vol. 5964:
Detectors and Associated Signal Processing II
Jean-Pierre Chatard; Peter N. J. Dennis, Editor(s)

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