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Proceedings Paper

New advances in improving low-temperature stability of infrared thin-film interference filters
Author(s): B. Li; S. Y. Zhang; D. Q. Liu; F. S. Zhang
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Paper Abstract

The degeneration of performance of an optical thin-film interference filter associated with the change of temperature is not acceptable. In this letter, we report a new progress in improving low-temperature performance of infrared narrow-band filters by using Pb1-xGexTe initial bulk alloy with appropriate Ge concentration x. It can be found that there exists a critical temperature for the investigated narrow-band filter, at which the temperature coefficient of filter is exactly zero. Therefore, by means of controlling the composition in (Pb1-xGex)1-yTey layers, the temperature coefficient of filter can be tunable at the designated low-temperature. In our present investigation, when temperature varies from 300 to 85 K, a shift of peak wavelength of 0.05935 nm.K-1 has been achieved.

Paper Details

Date Published: 5 October 2005
PDF: 6 pages
Proc. SPIE 5963, Advances in Optical Thin Films II, 596328 (5 October 2005); doi: 10.1117/12.625375
Show Author Affiliations
B. Li, Shanghai Institute of Technical Physics, CAS (China)
S. Y. Zhang, Shanghai Institute of Technical Physics, CAS (China)
D. Q. Liu, Shanghai Institute of Technical Physics, CAS (China)
F. S. Zhang, Shanghai Institute of Technical Physics, CAS (China)


Published in SPIE Proceedings Vol. 5963:
Advances in Optical Thin Films II
Claude Amra; Norbert Kaiser; H. Angus Macleod, Editor(s)

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