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Proceedings Paper

Failure analysis of PC MCT caused by current
Author(s): Dafu Liu; Ligang Wu; Yonggang Yuan; Lianmei Zhang; Xiufang Jin; Haimei Gong
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Paper Abstract

The influence of larger constant current burning was studied and analyses on the failed detectors were given. "1/f" noise is observed in the reign of g-r noise, and the exponential factor had a trend of increasing with burning time. Peak wavelength and cutoff wavelength of the detectors had no apparent change during electrical burning, but there were decreases on the short wavelength side in spectral response. After a long time burning, minority carrier lifetime of the detectors decreased as well as black-body signals. Analyses showed that defects increased at the surface of detectors after burning, which was responsible for decreasing the detector performance, even detector failure.

Paper Details

Date Published: 15 October 2005
PDF: 7 pages
Proc. SPIE 5964, Detectors and Associated Signal Processing II, 596415 (15 October 2005); doi: 10.1117/12.625046
Show Author Affiliations
Dafu Liu, Shanghai Institute of Technical Physics, CAS (China)
Graduate School of the Chinese Academy of Sciences (China)
Ligang Wu, Shanghai Institute of Technical Physics, CAS (China)
Graduate School of the Chinese Academy of Sciences (China)
Yonggang Yuan, Shanghai Institute of Technical Physics, CAS (China)
Lianmei Zhang, Shanghai Institute of Technical Physics, CAS (China)
Xiufang Jin, Shanghai Institute of Technical Physics, CAS (China)
Haimei Gong, Shanghai Institute of Technical Physics, CAS (China)


Published in SPIE Proceedings Vol. 5964:
Detectors and Associated Signal Processing II
Jean-Pierre Chatard; Peter N. J. Dennis, Editor(s)

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