Share Email Print
cover

Proceedings Paper

X-ray generation from thin targets mounted inside a compact betatron
Author(s): V. V. Kaplin; S. R. Uglov; O. F. Bulaev; V. J. Goncharov; A. A. Voronin; I. Vaskovsky; G. Sergeev; N. N. Nasonov; A. Sl. Kubankin; Melvin A. Piestrup; Michael K. Fuller; Charles K. Gary
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

We present measurements of x-ray emission from relativistic electrons passing through crystals and multilayer nanostructures mounted inside betatrons. Both spectra and yields have been measured. The measured spatial distributions and orientation dependencies are presented and are found to be in good agreement with theory. Betatrons developed over the past 30 years in Russia are compact and relatively inexpensive compared to LINACs and Storage Rings, and thus can be used in small laboratory settings. Various thin novel radiators mounted inside the betatron toroid can be used to generate (1) monochromatic tunable x-rays from crystalline and multilayer targets (2) tailored gamma-ray emission spectra from single thin foils and (3) soft x-ray spectra from multiple thin foils (transition radiation). Although betatrons have relatively low current, the thin radiators permit the multipassing of the electron beam for increased efficiency.

Paper Details

Date Published: 30 August 2005
PDF: 7 pages
Proc. SPIE 5917, Fourth Generation X-Ray Sources and Optics III, 59170J (30 August 2005); doi: 10.1117/12.624918
Show Author Affiliations
V. V. Kaplin, Tomsk Polytechnic Univ. (Russia)
S. R. Uglov, Tomsk Polytechnic Univ. (Russia)
O. F. Bulaev, Tomsk Polytechnic Univ. (Russia)
V. J. Goncharov, Tomsk Polytechnic Univ. (Russia)
A. A. Voronin, Tomsk Polytechnic Univ. (Russia)
I. Vaskovsky, Tomsk Polytechnic Univ. (Russia)
G. Sergeev, Tomsk Polytechnic Univ. (Russia)
N. N. Nasonov, Belgorod State Univ. (Russia)
A. Sl. Kubankin, Belgorod State Univ. (Russia)
Melvin A. Piestrup, Adelphi Technology, Inc. (United States)
Michael K. Fuller, Adelphi Technology, Inc. (United States)
Charles K. Gary, Adelphi Technology, Inc. (United States)


Published in SPIE Proceedings Vol. 5917:
Fourth Generation X-Ray Sources and Optics III
Roman O. Tatchyn; Sandra G. Biedron; Wolfgang Eberhardt, Editor(s)

© SPIE. Terms of Use
Back to Top