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Proceedings Paper

PIN-photodiode based pixel architecture for high-speed optical distance measurement systems
Author(s): Klaus Oberhauser; Alexander Nemecek; Horst Zimmermann
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Paper Abstract

Contact-less optical distance measurement systems are necessary to obtain 3D-information of an entire scene. To be able to determine depth information of the scene by a sensor without moving parts like e.g. scanner, it is necessary to measure the distance from the camera to an object in every single pixel. A new pixel for such a 3D-camera is presented. The operating principle is based on the time-of-flight (TOF) of laser light from a modulated light source to a diffuse reflecting object and back to the receiver IC. The receiver is implemented as an opto-electronic integrated circuit (OEIC). It consists of a fast, efficient PIN-photodiode having a 3dB bandwidth of about 1.35 GHz, a single-stage transimpedance amplifier and an electronic mixer on a single silicon chip. By correlating the received optical signal and the original electronic modulation signal, the phase-shift between sent and received signal can be determined. By performing correlation with a delayed modulation signal it is possible to eliminate the influence of object reflectivity and background illumination. The measurement time for a single distance measurement is 500μs for a range up to 3.7m. The standard deviation at 2.5m is better than 3cm for a transmitted optical power of 1.44mW at a wavelength of 650nm. The OEIC was fabricated in a slightly modified BiCMOS 0.6μm process. The diameter of the photosensitive area of the integrated PIN-photodiode is 100μm. The effective pixel size is about 220x400μm2. Therefore a fill factor of ~9% is reached.

Paper Details

Date Published: 14 October 2005
PDF: 10 pages
Proc. SPIE 5964, Detectors and Associated Signal Processing II, 59640H (14 October 2005); doi: 10.1117/12.624594
Show Author Affiliations
Klaus Oberhauser, Vienna Univ. of Technology (Austria)
Alexander Nemecek, Vienna Univ. of Technology (Austria)
Horst Zimmermann, Vienna Univ. of Technology (Austria)


Published in SPIE Proceedings Vol. 5964:
Detectors and Associated Signal Processing II
Jean-Pierre Chatard; Peter N. J. Dennis, Editor(s)

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