Share Email Print
cover

Proceedings Paper

Cryogenic performance of a lightweight silicon carbide mirror
Author(s): Ron Eng; James R. Carpenter; Colby A. Foss; James B. Hadaway; Harlan J. Haight; William D. Hogue; David Kane; Jeffrey R. Kegley; H. Philip Stahl; Ernest R. Wright
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Low cost, high performance lightweight Silicon Carbide (SiC) mirrors provide an alternative to Beryllium mirrors. A Trex Enterprises 0.25m diameter low areal density SiC mirror using its patented Chemical Vapor Composites (CVC) technology was evaluated for its optical performance at cryogenic temperature. CVC SiC is chemically pure, thermally stable, and mechanically stiff. CVC technology yields higher growth rate than that of CVD SiC. NASA has funded lightweight optical materials technology development efforts for future space based telescope programs. As part of these efforts, a Trex SiC mirror was measured interferometrically from room temperature to 30 degrees Kelvin. This paper will discuss the test goals, the cryogenic optical testing infrastructure and instrumentation at MSFC, test results, and lessons learned.

Paper Details

Date Published: 30 August 2005
PDF: 8 pages
Proc. SPIE 5868, Optical Materials and Structures Technologies II, 58680Q (30 August 2005); doi: 10.1117/12.624292
Show Author Affiliations
Ron Eng, NASA Marshall Space Flight Ctr. (United States)
James R. Carpenter, NASA Marshall Space Flight Ctr. (United States)
Colby A. Foss, Trex Advanced Materials (United States)
James B. Hadaway, Univ. of Alabama in Huntsville (United States)
Harlan J. Haight, NASA Marshall Space Flight Ctr. (United States)
William D. Hogue, NASA Marshall Space Flight Ctr. (United States)
David Kane, Trex Advanced Materials (United States)
Jeffrey R. Kegley, NASA Marshall Space Flight Ctr. (United States)
H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
Ernest R. Wright, NASA Marshall Space Flight Ctr. (United States)


Published in SPIE Proceedings Vol. 5868:
Optical Materials and Structures Technologies II
William A. Goodman, Editor(s)

© SPIE. Terms of Use
Back to Top