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Proceedings Paper

3D interferometric measurement system for machine tool on-line control
Author(s): V. Micó; M. T. Molina-Jiménez; J. Caballero-Aroca; S. Simón-Martín; E. Pérez-Picazo; A. R. Jiménez; L. Calderón; M. Calvache; F. Seco; R. Bueno
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Paper Abstract

We present the definition and development of a three dimensional high precision measurement system for localisation and control of machine tool's drill based on a Michelson-Morley interferometric configuration and a laser tracking subsystem to redirect the measurement beam onto a retro-reflector positioned in the tool nearness. The system measures the retro-reflector position in real time with 5 microns accuracy up to 2 m/s processing material velocities and it is used to carry out an on-line control feedback of the drill position in the machine tool allowing a drill tool replacement during the fabrication process. The system has been integrated and tested in an especially designed machine tool built for this application.

Paper Details

Date Published: 7 October 2005
PDF: 8 pages
Proc. SPIE 5948, Photonics Applications in Industry and Research IV, 59482N (7 October 2005); doi: 10.1117/12.623755
Show Author Affiliations
V. Micó, AIDO-Technological Institute of Optics, Colour and Imaging (Spain)
M. T. Molina-Jiménez, AIDO-Technological Institute of Optics, Colour and Imaging (Spain)
J. Caballero-Aroca, AIDO-Technological Institute of Optics, Colour and Imaging (Spain)
S. Simón-Martín, AIDO-Technological Institute of Optics, Colour and Imaging (Spain)
E. Pérez-Picazo, AIDO-Technological Institute of Optics, Colour and Imaging (Spain)
A. R. Jiménez, CSIC-Instituto de Automática Industrial (Spain)
L. Calderón, CSIC-Instituto de Automática Industrial (Spain)
M. Calvache, CSIC-Instituto de Automática Industrial (Spain)
F. Seco, CSIC-Instituto de Automática Industrial (Spain)
R. Bueno, Fundación Fatronik (Spain)


Published in SPIE Proceedings Vol. 5948:
Photonics Applications in Industry and Research IV
Ryszard S. Romaniuk; Stefan Simrock; Vladimir M. Lutkovski, Editor(s)

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