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Proceedings Paper

Low-cost microinterferometric tomography system for 3D refraction index distribution measurements in the optical fiber splices
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Paper Abstract

Nowadays development of optical networks causes significant grow of interest in reliable fiber connections. Although fiber splicing techniques are well known, the assessment of a joint quality still bases on the simple image processing estimation. In advanced applications such solution is not sufficient and more trustworthy method is needed. One of the promising techniques of reliable measurements is microinterferometric tomography which allows determination of three-dimensional refractive index distributions in phase isotropic microelements. Measurement bases on interferometric scan of the tested element. Contrary to the classical testing methods based on attenuation tests microinterferometric tomography analyses an inspected fiber with the beam passing perpendicularly to the fiber axis. Tomographic scans taken for numerous, well defined angular positions and further calculations result 3D map of the area with clearly seen splice zone. In this paper we propose the novel design of the integrated low-cost microinterferometric tomography setup (fig.1). The system is built as the waveguide Mach-Zehnder interferometer with reduced vibration sensitivity due to using the grating beamsplitter and recombiner. Additionally we present the details of design of microinterferometric tomography setup and the initial remarks on the possibility to fabricate it with Deep Lithography with Protons (DLP) - unique master prototyping technology of fabrication both micromechanical and microoptical elements in polymer material. We aim to take an advantage of compactness and reduced dimensions of the interferometer to implement it as the possible accessory of the commercial optical fiber splicer.

Paper Details

Date Published: 23 May 2005
PDF: 4 pages
Proc. SPIE 5855, 17th International Conference on Optical Fibre Sensors, (23 May 2005); doi: 10.1117/12.623445
Show Author Affiliations
Rafal Krajewski, Warsaw Univ. of Technology (Poland)
Vrie Univ. Brussel (Belgium)
Malgorzata Kujawinska, Warsaw Univ. of Technology (Poland)
Bart Volckaerts, Vrije Univ. Brussel (Belgium)
Hugo Thienpont, Vrije Univ. Brussel (Belgium)

Published in SPIE Proceedings Vol. 5855:
17th International Conference on Optical Fibre Sensors
Marc Voet; Reinhardt Willsch; Wolfgang Ecke; Julian Jones; Brian Culshaw, Editor(s)

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