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Proceedings Paper

Biaxial ellipsometry
Author(s): Russell A. Chipman
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Paper Abstract

Biaxial ellipsometry measures the optical constants of materials, anisotropic films, and stacks of anisotropic films. Materials of interest include birefringent crystals, polarizing materials and films, and the complex multilayer anisotropic structures used in liquid crystal displays. An approach using Mueller matrix imaging polarimetry to simultaneously measure and angularly resolve reflection and transmission over large solid angles is presented. Biaxial materials have three refractive indices and three absorption coefficients in orthogonal directions but with arbitrary orientation. Determination of the dielectric tensor provides a succinct and suitable material representation, and its accurate determination is the focus of this investigation.

Paper Details

Date Published: 18 August 2005
PDF: 8 pages
Proc. SPIE 5875, Novel Optical Systems Design and Optimization VIII, 587506 (18 August 2005); doi: 10.1117/12.623405
Show Author Affiliations
Russell A. Chipman, Optical Sciences Ctr./Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 5875:
Novel Optical Systems Design and Optimization VIII
Jose M. Sasian; R. John Koshel; Richard C. Juergens, Editor(s)

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