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Studies of interface polarization and magnetization dynamics using terahertz emission spectroscopy
Author(s): Shayne M. Harrel; James M. Schleicher; Eric Beaurepaire; Jean-Yves Bigot; Charles A. Schmuttenmaer
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Paper Abstract

Much can be learned about charge and magnetization dynamics at surfaces and in nanometer thickness films through terahertz emission spectroscopy (TES). In some respects, TES is the difference-frequency analog of second harmonic generation (SHG). As such, interface-specific properties contribute to the generation of a THz pulse upon ultrafast optical excitation. In addition, there can be bulk contributions as well, as is also true in SHG. The dependence of THz pulse emission on surface orientation has been used to study carrier dynamics, both real and virtual, in GaAs(111). We find that the dependence on the angle of linearly polarized excitation is well described by known theory. Magnetization dynamics in polycrystalline nickel films ranging in thickness from 5 nm to 60 nm have also been characterized with TES. Distinct bulk and surface contributions each play a role, and their origins are discussed.

Paper Details

Date Published: 18 August 2005
PDF: 9 pages
Proc. SPIE 5929, Physical Chemistry of Interfaces and Nanomaterials IV, 592910 (18 August 2005); doi: 10.1117/12.623174
Show Author Affiliations
Shayne M. Harrel, Yale Univ. (United States)
James M. Schleicher, Yale Univ. (United States)
Eric Beaurepaire, IPCMS, CNRS-Univ. Louis Pasteur (France)
Jean-Yves Bigot, IPCMS, CNRS-Univ. Louis Pasteur (France)
Charles A. Schmuttenmaer, Yale Univ. (United States)

Published in SPIE Proceedings Vol. 5929:
Physical Chemistry of Interfaces and Nanomaterials IV
Clemens Burda; Randy J. Ellingson, Editor(s)

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