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Proceedings Paper

Stability of high-pressure xenon gamma-ray spectrometers
Author(s): Albert Beyerle
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Paper Abstract

The stability of high-pressure xenon gamma-ray specrometers has been measured at Mirmar Sensor. Stability was measured by tracking the 137Cs peak of the entire spectroscopy system including detector, preamplifier, amplifier, and multichannle analyzer over 6 days in a laboratory setting. Overall system gain drift is about 0.016%. Resolution drifts are about 0.15%. The overall energy resolution is between 1.7 and 1.8% at 662 keV.

Paper Details

Date Published: 17 September 2005
PDF: 6 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220C (17 September 2005); doi: 10.1117/12.622628
Show Author Affiliations
Albert Beyerle, Mirmar Sensor, LLC (United States)


Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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