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Proceedings Paper

Analysis of some basic properties of multicavity photoacoustic Helmholtz cells
Author(s): Tomasz Starecki; Katarzyna Opalska; Aleksander Burd; Stefan Misiaszek; Michal Ramotowski
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Paper Abstract

The paper presents results of comparative analysis of some basic properties of multicavity photoacoustic Helmholtz cells. The analysed cells were three-cavity Helmholtz resonators formed from a standard dual-cavity photoacoustic Helmholtz cell with an additional cavity connected by means of a capillary with the sample cavity of the cell at the other end. Influence of change of the volume of the additional cavity as well as diameter and length of the connecting duct on the microphone signal vs. frequency was studied. Analysis was based on computer simulations in which a modified transmission line model was used. The model was improved by introducing of additional damping factors which values were extracted from measurements of number of practically implemented dual-cavity photoacoustic Helmholtz cells. The analysis showed that additional cavity makes it possible to improve shape of the frequency response of the cell. In particular it is possible to extend range of frequencies in which resonance properties of the cell can be used for the purpose of photoacoustic signal amplification. It should be noticed that choice of the cell dimensions must be careful, as some combinations decrease resonance properties of the cell.

Paper Details

Date Published: 8 October 2005
PDF: 9 pages
Proc. SPIE 5948, Photonics Applications in Industry and Research IV, 59481M (8 October 2005); doi: 10.1117/12.622192
Show Author Affiliations
Tomasz Starecki, Warsaw Univ. of Technology (Poland)
Katarzyna Opalska, Warsaw Univ. of Technology (Poland)
Aleksander Burd, Warsaw Univ. of Technology (Poland)
Stefan Misiaszek, Warsaw Univ. of Technology (Poland)
Michal Ramotowski, Warsaw Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 5948:
Photonics Applications in Industry and Research IV
Ryszard S. Romaniuk; Stefan Simrock; Vladimir M. Lutkovski, Editor(s)

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