Share Email Print

Proceedings Paper

The quantum efficiency and stability of UV and soft x-ray photocathodes
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The sensitivity of many detection devices is established by the use photocathodes for the conversion of incoming photons into photoelectrons. The choice of photocathode material is determined by the spectral range where the sensitivity of the device is most important. Alkali halides are very efficient photocathodes in the ultraviolet and soft X-ray wavelength ranges and are widely used in many scientific applications. Although they are relatively stable under short exposure to atmosphere, which substantially simplifies production and handling of detection devices, it was found that their sensitivity can be substantially reduced by intense UV or X-ray irradiation (photocathode's ageing). A detailed study of alkali halide photocathodes efficiency and their ageing under intense UV and X-ray irradiation as well as some methods of increasing the stability are presented. The quantum efficiency of amorphous diamond films were shown to be slightly lower than the efficiency of some alkali halide films, but the chemical and mechanical stability and yet to be confirmed radiation hardness of diamond photocathodes make them very attractive for many UV and soft X-ray applications. Multialkalis and new materials such as GaN, AlGaN, GaAs could be used to extend the sensitivity to longer wavelengths, but require in situ processing in very high vacuum.

Paper Details

Date Published: 22 September 2005
PDF: 13 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 59200I (22 September 2005); doi: 10.1117/12.621761
Show Author Affiliations
Anton S. Tremsin, Univ. of California, Berkeley (United States)
Oswald H. W. Siegmund, Univ. of California, Berkeley (United States)

Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Stuart Kleinfelder; Dennis L. Paisley; Jean-Claude Kieffer; Jerome B. Hastings, Editor(s)

© SPIE. Terms of Use
Back to Top