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Proceedings Paper

Profilometry using optical edge projection
Author(s): Hong Miao; Chenggen Quan; Cho Jui Tay; Xiao Ping Wu
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Paper Abstract

A novel optical edge projection method to measure the profile of an object is proposed. It can be applied to some special field for example to measure a profile of a specimen with a black and soft surface. A structured black-and-white light edge is projected onto an object surface and the distorted optical edge shadow image is captured by a CCD camera. The border line of the optical edge shadow is extracted and compared with a reference line, the distortion modulated by the height of the object surface is then obtained. By calculating the height, and scanning the optical edge shadow along the object, the height information obtained from a series of images can be determined. Combining the border line in these images, the profile of the object can be measured.

Paper Details

Date Published: 12 April 2005
PDF: 6 pages
Proc. SPIE 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, (12 April 2005); doi: 10.1117/12.621482
Show Author Affiliations
Hong Miao, National Univ. of Singapore (Singapore)
Univ. of Science and Technology of China (China)
Chenggen Quan, National Univ. of Singapore (Singapore)
Cho Jui Tay, National Univ. of Singapore (Singapore)
Xiao Ping Wu, Univ. of Science and Technology of China (China)


Published in SPIE Proceedings Vol. 5852:
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
Chenggen Quan; Fook Siong Chau; Anand Asundi; Brian Stephen Wong; Chwee Teck Lim, Editor(s)

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