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Proceedings Paper

A novel phase measurement profilometry based on linear CCD array
Author(s): Hong Zhao; Zhihua Zhao; Kejian Jiang; Yuanhe Song
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Paper Abstract

A new fast 3D profilometry is presented in this paper. Although the phase measuring method can reach more high precision , its real measurement speed is very low and can't be applied on production lines because of its phase-shift operations. Three lines CCD arrays, 1024 pixels each, are mounted together with the same distance intervals. Needless to perform phase shift operations, the CCD can consecutively scan and grab 3 phase distributed pictures which will be separately calculated by 3 DSP processors. Thus the whole measurement process is finished. The experimental results show that the phase measurement system by using three-line CCD has high application values for its high precision and speed.

Paper Details

Date Published: 12 April 2005
PDF: 4 pages
Proc. SPIE 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics, (12 April 2005); doi: 10.1117/12.621463
Show Author Affiliations
Hong Zhao, Xi'an Jiaotong Univ. (China)
Zhihua Zhao, Xi'an Jiaotong Univ. (China)
Kejian Jiang, Xi'an Jiaotong Univ. (China)
Yuanhe Song, Xi'an Jiaotong Univ. (China)
AF Engineering Univ. (China)


Published in SPIE Proceedings Vol. 5852:
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
Chenggen Quan; Fook Siong Chau; Anand Asundi; Brian Stephen Wong; Chwee Teck Lim, Editor(s)

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