Share Email Print
cover

Proceedings Paper

Optical cross-talk effect in a semiconductor photon-counting detector array
Author(s): Ivan Prochazka; Karel Hamal; Lukas Kral; Josef Blazej
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Solid state single photon detectors are getting more and more attention in various areas of applied physics: optical sensors, communication, quantum key distribution, optical ranging and Lidar, time resolved spectroscopy, opaque media imaging and ballistic photon identification. Avalanche photodiodes specifically designed for single photon counting semiconductor avalanche structures have been developed on the basis of various materials: Si, Ge, GaP, GaAsP and InGaAs/InGaAsP at the Czech Technical University in Prague during the last 20 years. They have been tailored for numerous applications. Recently, there is a strong demand for the photon counting detector in a form of an array; even small arrays 10x1 or 3x3 are of great importance for users. Although the photon counting array can be manufactured, there exists a serious limitation for its performance: the optical cross-talk between individual detecting cells. This cross-talk is caused by the optical emission of the avalanche photon counting structure which accompanies the photon detection process. We have studied in detail the optical emission of the avalanche photon counting structure in the silicon shallow junction type photodiode. The timing properties, radiation pattern and spectral distribution of the emitted light have been measured for various detection structures and their different operating conditions. The ultimate limit for the cross-talk has been determined and the methods for its limitation have been proposed.

Paper Details

Date Published: 30 September 2005
PDF: 4 pages
Proc. SPIE 5956, Integrated Optics: Theory and Applications, 59560Y (30 September 2005); doi: 10.1117/12.621362
Show Author Affiliations
Ivan Prochazka, Czech Technical Univ. in Prague (Czech Republic)
Karel Hamal, Czech Technical Univ. in Prague (Czech Republic)
Lukas Kral, Czech Technical Univ. in Prague (Czech Republic)
Josef Blazej, Czech Technical Univ. in Prague (Czech Republic)


Published in SPIE Proceedings Vol. 5956:
Integrated Optics: Theory and Applications
Tadeusz Pustelny; Paul V. Lambeck; Christophe Gorecki, Editor(s)

© SPIE. Terms of Use
Back to Top