Share Email Print
cover

Proceedings Paper

Dynamic interferometry
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The largest limitation of phase-shifting interferometry for optical testing is the sensitivity to the environment, both vibration and air turbulence. In many situations the measurement accuracy is limited by the environment and sometimes the environment is sufficiently bad that the measurement cannot be performed. Recently there have been several advances in dynamic interferometry techniques for reducing effects of vibration. This talk will describe and compare two dynamic interferometry techniques; simultaneous phase-shifting interferometry and a special form of spatial carrier interferometry utilizing a micropolarizer phase-shifting array.

Paper Details

Date Published: 30 August 2005
PDF: 10 pages
Proc. SPIE 5875, Novel Optical Systems Design and Optimization VIII, 58750F (30 August 2005); doi: 10.1117/12.621245
Show Author Affiliations
Neal Brock, 4D Technology (United States)
John Hayes, 4D Technology (United States)
Brad Kimbrough, College of Optical Sciences, Univ. of Arizona (United States)
James Millerd, 4D Technology (United States)
Michael North-Morris, 4D Technology (United States)
Matt Novak, College of Optical Sciences, Univ. of Arizona (United States)
James C. Wyant, College of Optical Sciences, Univ. of Arizona (United States)


Published in SPIE Proceedings Vol. 5875:
Novel Optical Systems Design and Optimization VIII
Jose M. Sasian; R. John Koshel; Richard C. Juergens, Editor(s)

© SPIE. Terms of Use
Back to Top