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Proceedings Paper

Latest metrology results with the SOLEIL synchrotron LTP
Author(s): Muriel Thomasset; Sylvain Brochet; Francois Polack
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Paper Abstract

SOLEIL Long Trace Profiler (LTP) is a custom made instrument developed in the former LURE. As many instruments of its kind, it is based on pencil beam interferometry and uses the principle of stabilisation of the probe beam by a pentaprism equivalent reflector. The interferometer however is a polarization interferometer located close to the surface under test. The optics head can be configured to measure the optics in its working position: face up, face down or sideways. Particular care is given to absolute calibration because the precise knowledge of radii of curvature is required to determine the grazing angle and align accurately the synchrotron beamlines. A reproducible calibration procedure has been defined and checked against various reference surfaces. The main limitation to accuracy is the beam instability due to aur turbulence and thermal drifts. Careful confinement, oversampled acquisitions, and data averaging can minimize this effect. Noise is not uniformly distributed over spatial frequencies. In order to better understand the influence of beam footprint on the surface under test, and the characteristics of the beam fluctuation, we have constructed a special head where two measurements, one with a narrow pencil beam and interferometric detection and another with a large unmodulated beam and centroid detection, can be done simultaneously. The first results obtained from this device are presented here.

Paper Details

Date Published: 15 September 2005
PDF: 9 pages
Proc. SPIE 5921, Advances in Metrology for X-Ray and EUV Optics, 592102 (15 September 2005); doi: 10.1117/12.621073
Show Author Affiliations
Muriel Thomasset, Synchrotron SOLEIL (France)
Sylvain Brochet, Synchrotron SOLEIL (France)
Francois Polack, Synchrotron SOLEIL (France)

Published in SPIE Proceedings Vol. 5921:
Advances in Metrology for X-Ray and EUV Optics
Lahsen Assoufid; Peter Z. Takacs; John S. Taylor, Editor(s)

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