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Proceedings Paper

Dynamic phase-shifting electronic speckle pattern interferometer
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Paper Abstract

The technique for measuring changes in diffuse surfaces using Electronic Speckle Pattern Interferometry (ESPI) is well known. We present a new electronic speckle pattern interferometer that takes advantage of a single-frame spatial phase-shifting technique to significantly reduce sensitivity to vibration and enable complete data acquisition in a single laser pulse. The interferometer was specifically designed to measure the stability of the James Webb Space Telescope (JWST) backplane. During each measurement the laser is pulsed once and four phase-shifted interferograms are captured in a single image. The signal is integrated over the 9ns pulse which is over six orders of magnitude shorter than the acquisition time for conventional interferometers. Consequently, the measurements do not suffer from the fringe contrast reduction and measurement errors that plague temporal phase-shifting interferometers in the presence of vibration. This paper will discuss the basic operating principle of the interferometer, analyze its performance and show some interesting measurements.

Paper Details

Date Published: 18 August 2005
PDF: 9 pages
Proc. SPIE 5869, Optical Manufacturing and Testing VI, 58691B (18 August 2005); doi: 10.1117/12.620619
Show Author Affiliations
Michael North Morris, 4D Technology Corp. (United States)
James Millerd, 4D Technology Corp. (United States)
Neal Brock, 4D Technology Corp. (United States)
John Hayes, 4D Technology Corp. (United States)
Babak Saif, Space Telescope Science Institute (United States)


Published in SPIE Proceedings Vol. 5869:
Optical Manufacturing and Testing VI
H. Philip Stahl, Editor(s)

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