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Proceedings Paper

Novel technologies for x-ray multi-foil optics
Author(s): R. Hudec; L. Pina; A. Inneman; L. Sveda; V. Semencova; M. Skulinova; V. Brozek; M. Mika; R. Kacerovsky; J. Sik
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Paper Abstract

The future large space X-ray telescopes in study (such as the ESAs XEUS) require novel approaches and innovative lightweight technologies. Although there are several alternative possibilities, in general the shaped thin glass foils and shaped Si wafers are considered to belong to the most promising ones. We present and discuss the recent progress in these technologies, as well as properties of test mirrors produced and tested. For both technologies, both flat and curved samples have been produced and tested. The achieved profile accuracy is of order of 1 micrometer or better, while the bending technologies maintain the intrinsic fine surface microroughness of substrates (better than 0.5 nm).

Paper Details

Date Published: 1 September 2005
PDF: 12 pages
Proc. SPIE 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II, 59000Y (1 September 2005); doi: 10.1117/12.620425
Show Author Affiliations
R. Hudec, Astronomical Institute (Czech Republic)
Ctr. of Advanced X-Ray Technologies, Reflex (Czech Republic)
L. Pina, Czech Technical Univ. (Czech Republic)
Ctr. of Advanced X-Ray Technologies, Reflex (Czech Republic)
A. Inneman, Ctr. of Advanced X-Ray Technologies, Reflex (Czech Republic)
L. Sveda, Czech Technical Univ. (Czech Republic)
V. Semencova, Ctr. of Advanced X-Ray Technologies, Reflex (Czech Republic)
Institute of Chemical Technology (Czech Republic)
M. Skulinova, Ctr. of Advanced X-Ray Technologies, Reflex (Czech Republic)
Institute of Chemical Technology (Czech Republic)
V. Brozek, Institute of Plasma Physics (Czech Republic)
M. Mika, Institute of Chemical Technology (Czech Republic)
R. Kacerovsky, Institute of Chemical Technology (Czech Republic)
J. Sik, ON Semiconductor (Czech Republic)


Published in SPIE Proceedings Vol. 5900:
Optics for EUV, X-Ray, and Gamma-Ray Astronomy II
Oberto Citterio; Stephen L. O'Dell, Editor(s)

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