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Proceedings Paper

A new approach of surface roughness measurement using optical method and image processing
Author(s): K. P. Chaudhary; R. P. Singhal; Shashi K. Singh; Chandera Shakher
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Paper Abstract

This paper presents a new approach for surface roughness measurement using optical method and image processing. It has an advantage over traditional method where the surface geometry is not touched and line to line scanning is not required. In this system, a CCD camera is used to grab the image of the roughness sample using optical set up along with image processing software and hardware. This paper explains how 3D parameters can be measured to provide greater insight into surface finish. It also includes two cases in which 3D parameters measurements are essential in the design and development of high performance surfaces. Experimental results demonstrated good correlation between the received signal parameters and the root mean square surface roughness. A range of roughness up to 10μm. was detected, with a resolution of 0.01μm.

Paper Details

Date Published: 18 August 2005
PDF: 11 pages
Proc. SPIE 5879, Recent Developments in Traceable Dimensional Measurements III, 587914 (18 August 2005); doi: 10.1117/12.620277
Show Author Affiliations
K. P. Chaudhary, National Physical Lab. (India)
R. P. Singhal, National Physical Lab. (India)
Shashi K. Singh, ABBES Engineering College Gaziabad UP (India)
Chandera Shakher, Indian Institute of Technology (India)


Published in SPIE Proceedings Vol. 5879:
Recent Developments in Traceable Dimensional Measurements III
Jennifer E. Decker; Gwo-Sheng Peng, Editor(s)

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