Share Email Print

Proceedings Paper

Developments in the realization of diffuse reflectance scales at NPL
Author(s): Christopher J. Chunnilall; Frank J. J. Clarke; Michael J. Shaw
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The United Kingdom scales for diffuse reflectance are realized using two primary instruments. In the 360 nm to 2.5 μm spectral region the National Reference Reflectometer (NRR) realizes absolute measurement of reflectance and radiance factor by goniometric measurements. Hemispherical reflectance scales are obtained through the spatial integration of these goniometric measurements. In the mid-infrared region (2.5 μm - 55 μm) the hemispherical reflectance scale is realized by the Absolute Hemispherical Reflectometer (AHR). This paper describes some of the uncertainties resulting from errors in aligning the NRR and non-ideality in sample topography, together with its use to carry out measurements in the 1 - 1.6 μm region. The AHR has previously been used with grating spectrometers, and has now been coupled to a Fourier transform spectrometer.

Paper Details

Date Published: 18 August 2005
PDF: 12 pages
Proc. SPIE 5880, Optical Diagnostics, 58800V (18 August 2005); doi: 10.1117/12.620268
Show Author Affiliations
Christopher J. Chunnilall, National Physical Lab. (United Kingdom)
Frank J. J. Clarke, National Physical Lab. (United Kingdom)
Michael J. Shaw, National Physical Lab. (United Kingdom)

Published in SPIE Proceedings Vol. 5880:
Optical Diagnostics
Leonard M. Hanssen; Patrick V. Farrell, Editor(s)

© SPIE. Terms of Use
Back to Top