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Proceedings Paper

An ultra-fast electron diffraction system
Author(s): Wu Jianjun; Zhao Baosheng; Tian Jinshou; Wang Junfeng; Zou Wei; Sai Xiaofeng; Liu Yunquan; Zhang Jie
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Paper Abstract

Time-resolved electron diffraction has been widely studied in the last few years and several instruments have been employed in the studying of the structural phase transitions of various materials. The electron diffraction system designed by the present research group consists of an ultra-fast electron gun, a sample chamber, a readout system, a power supply system, and a vacuum system, and it bears such unique characteristics as high energy, high temporal resolution, and high detection capacity. The photocathode is of a 35nm Ag film deposited on an MgF2 glass disk, and it is sensitive to ultraviolet light with wavelength of 266nm. A magnetic lens is used to focus the electrons. Two pairs of electric deflection plates are used in the X and Y directions respectively to control the movement of the electrons, and one pair of them will act as a scanning plate while measuring the pulse width of electrons. The sample chamber is made of stainless steel, and in the middle of the chamber there is a specimen holder, capable of shifting in three dimensions and turning around its axis. The diffraction pattern recording system has a very high detecting efficiency, and even a single electron could be detected. A cascade MCP detector is used to ensure an electron gain reached to 104. The electron gun is in a vacuum system of 10-4Pa. The whole gun is shielded by a µ-metal sheath. The designed temporal resolution of the ultra-fast electron diffraction system (UED) is about 325fs.

Paper Details

Date Published:
PDF: 8 pages
Proc. SPIE 5920, Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications, 592018; doi: 10.1117/12.620155
Show Author Affiliations
Wu Jianjun, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Zhao Baosheng, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Tian Jinshou, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Wang Junfeng, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Zou Wei, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Sai Xiaofeng, Xi’an Institute of Optics and Precision Mechanics of CAS (China)
Liu Yunquan, Institute of Physics of CAS (China)
Zhang Jie, Institute of Physics of CAS (China)


Published in SPIE Proceedings Vol. 5920:
Ultrafast X-Ray Detectors, High-Speed Imaging, and Applications
Zenghu Chang; Jean-Claude Kieffer; Jerome B. Hastings; Stuart Kleinfelder; Dennis L. Paisley, Editor(s)

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