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Proceedings Paper

Evaluation of properties of various type CdTe hard x-ray detectors
Author(s): Asuka Togami; Yu Ishida; Toru Aoki; Yoshinori Hatanaka; Jiro Temmyo
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Paper Abstract

M-π -n detector and Schottky detector which were different barriers were evaluated by measuring spectrum as imaging detectors. These spectrum performances showed that the effect of polarization in these detectors was similarly occurred. The current-time characteristics and capacitance-time characteristics were measured for the detectors and it was found that these characteristics were due to the effect of polarization.

Paper Details

Date Published: 16 September 2005
PDF: 9 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 592210 (16 September 2005); doi: 10.1117/12.620071
Show Author Affiliations
Asuka Togami, Shizuoka Univ. (Japan)
Yu Ishida, Shizuoka Univ. (Japan)
Toru Aoki, Shizuoka Univ. (Japan)
Yoshinori Hatanaka, Aichi Univ. of Technology (Japan)
Jiro Temmyo, Shizuoka Univ. (Japan)


Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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