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Proceedings Paper

Energy distinction type CdTe two-dimension x-ray imaging device
Author(s): Daiji Furuhashi; Daisuke Sakashita; Yu Ishida; Toru Aoki; Yasuhiro Tomita; Yoshinori Hatanaka; Jiro Temmyo
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Paper Abstract

Photon-counting mode CdTe two-dimension X-ray imaging device with energy distinction function was investigated. Two-dimension M-π-n CdTe detectors were fabricated on 0.5mm-thick single CdTe wafer by the excimer laser pattern doping technique. It is important that the imaging detector shows uniform performance in all pixels, so we measured energy spectra of the two-dimensional detector fabricated by the excimer laser pattern doping technique. The energy spectra about 4 keV of FWHM of 122 keV peak of Co-57 were obtained, and it was found that uniformity was high in all pixels. For investigating charge share problem, 2 x 2 structured patterned-dope detector with and without separation ditches were prepared and compared. Both sample showed almost same crosstalk carrier, about 3% calculated from Co-57 radioisotope energy spectrum above 50 keV regions. Only 0.05 % crosstalk counts was obtained from both samples by using narrow 6 KeV energy windows at 122 keV for estimation in energy distinction imaging with energy window. These results show that patterned n-type doping by metal mask and excimer laser technique is effective for pixel separation CdTe x-ray imaging device.

Paper Details

Date Published: 17 September 2005
PDF: 11 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220Z (17 September 2005); doi: 10.1117/12.620064
Show Author Affiliations
Daiji Furuhashi, Shizuoka Univ. (Japan)
Daisuke Sakashita, Shizuoka Univ. (Japan)
Yu Ishida, Shizuoka Univ. (Japan)
Toru Aoki, Shizuoka Univ. (Japan)
Yasuhiro Tomita, Hamamatsu Photonics K.K. (Japan)
Yoshinori Hatanaka, Aichi Univ. of Technology (Japan)
Jiro Temmyo, Shizuoka Univ. (Japan)


Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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