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Proceedings Paper

X-ray color scanner with multiple energy discrimination capability
Author(s): Y. Tomita; Y. Shirayanagi; S. Matsui; T. Aoki; Y. Hatanaka
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Paper Abstract

An X-ray color scanner that can distinguish between different photon energies has been developed using X-ray line sensors. This scanner consists of a 64-channel cadmium telluride (CdTe) radiation detection array, a 64-channel application specific integrated circuit (ASIC), and a signal processing circuit that controls both the ASIC and data communication. An X-ray or gamma ray photon absorbed by the CdTe detector is converted into an electric charge proportional to the energy of the incident photon and amplified to an electric pulse with an amplitude proportional to the photon's energy. The pulse's height is then analyzed by the ASIC using 5 different threshold voltages. The X-ray color scanner has the ability to count up to approximately 2 million photons per CdTe element per second. When used as a photon counting system, the X-ray color sensor has a very high signal to noise ratio, since it removes electric noise in the low energy spectrum during the analysis process. When appropriately selected energy thresholds are used, X-ray color scanners, used for X-ray imaging or X-ray CT, were shown to remove the effects of beam-scattering noise and beam-hardening.

Paper Details

Date Published: 17 September 2005
PDF: 8 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 59220A (17 September 2005); doi: 10.1117/12.620025
Show Author Affiliations
Y. Tomita, Hamamatsu Photonics K.K. (Japan)
Y. Shirayanagi, Hamamatsu Photonics K.K. (Japan)
S. Matsui, Hamamatsu Photonics K.K. (Japan)
T. Aoki, Shizuoka Univ. (Japan)
Y. Hatanaka, Aichi Univ. of Technology (Japan)


Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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