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Proceedings Paper

The effects of precipitates on CdZnTe device performance
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Paper Abstract

A high-intensity X-ray beam collimated down to a 10-micrometer spot size, available at Brookhaven's National Synchrotron Light Source (NSLS), was employed to perform X-ray mapping to measure the correlation between microscopic defects (precipitates) and variations in the collected charges in long-drift CdZnTe (CZT) detectors. First, we use X-ray diffraction topography (XDT) measurements at the high-energy beamline and IR microscopy to identify the defects distribution and strains in the bulk of CZT crystals. Then, we perform X-ray raster scans of the CZT detectors to measure their responses with 10-micrometer spatial resolution. The brightness of the source allows for good statistics in very short times. Precipitates that were singled out with X-ray scans are locally investigated by applying pulse-shape analysis. The presentation discusses how precipitates affect the device performance.

Paper Details

Date Published: 31 August 2005
PDF: 7 pages
Proc. SPIE 5922, Hard X-Ray and Gamma-Ray Detector Physics VII, 592204 (31 August 2005); doi: 10.1117/12.619812
Show Author Affiliations
G. S. Camarda, Brookhaven National Lab. (United States)
A. E. Bolotnikov, Brookhaven National Lab. (United States)
G. A. Carini, Brookhaven National Lab. (United States)
Univ. of Palermo (Italy)
L. Li, Yinnel Tech, Inc. (United States)
G. W. Wright, Brookhaven National Lab. (United States)
R. B. James, Brookhaven National Lab. (United States)

Published in SPIE Proceedings Vol. 5922:
Hard X-Ray and Gamma-Ray Detector Physics VII
Ralph B. James; Larry A. Franks; Arnold Burger, Editor(s)

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