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Proceedings Paper

Sub-pixel precise image analysis in the industrial environment
Author(s): Alexey S. Potapov; Vadim R. Luciv; Igor A. Malyshev
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Paper Abstract

We present an approach to automatic sup-pixel precise measurement of the positions and local orientations of the holes and edge peculiarities of complex shapes in a sheet metal. The sub-pixel precision of measurement is reached by means of a model-based image analysis. A correlation based measure is introduced to obtain the measurement results invariant to illumination conditions. The correlation is calculated of the vector models and the brightness gradient field of the image region in which the local object of interest is expected to be found. The vector models are derived from the CAD-descriptions of industrial components. The task is solved in the context of photogrammetric 3D measurements for the quality control in the industrial environment.

Paper Details

Date Published: 29 April 2005
PDF: 5 pages
Proc. SPIE 5831, Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering, (29 April 2005); doi: 10.1117/12.619700
Show Author Affiliations
Alexey S. Potapov, Vavilov State Optical Institute (Russia)
Vadim R. Luciv, Vavilov State Optical Institute (Russia)
Igor A. Malyshev, Vavilov State Optical Institute (Russia)


Published in SPIE Proceedings Vol. 5831:
Eighth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering

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