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Proceedings Paper

A comparison of k-NN, backpropagation, and self-organising map classification methods using an optical fibre based sensor system utilised in an industrial large scale oven
Author(s): Cormac Sheridan; Marion O'Farrell; Elfed Lewis; William B. Lyons; Colin Flanagan; Nick Jackman
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Paper Abstract

This paper reports on three methods of classifying the spectral data from an optical fibre based sensor system as used in the food industry. The first method uses a feed-forward back-propagation Artificial Neural Network; the second method involves using Kohonen Self-Organising Maps while the third method is k-Nearest Neighbour analysis. The sensor monitors the food colour online as the food cooks by examining the reflected light from both the surface and the core of the product. The combination of using Principal Component Analysis and Backpropagation Neural Networks has been successfully investigated previously. In this paper, results obtained using all three classifiers are presented and compared. The Principal Components used to train each classifier are evaluated from data that generate a "colourscale" comprising six colour classifications. This scale has been developed to allow several products of similar colour to be tested using a single network that had been trained using the colourscale. The results presented show that both the neural network and the Self-Organising Map approach perform comparably, while the k-NN method tested under-performs the other two.

Paper Details

Date Published: 3 June 2005
PDF: 8 pages
Proc. SPIE 5826, Opto-Ireland 2005: Optical Sensing and Spectroscopy, (3 June 2005); doi: 10.1117/12.619555
Show Author Affiliations
Cormac Sheridan, Univ. of Limerick (Ireland)
Marion O'Farrell, Univ. of Limerick (Ireland)
Elfed Lewis, Univ. of Limerick (Ireland)
William B. Lyons, Univ. of Limerick (Ireland)
Colin Flanagan, Univ. of Limerick (Ireland)
Nick Jackman, Food Design Applications Ltd. (Ireland)


Published in SPIE Proceedings Vol. 5826:
Opto-Ireland 2005: Optical Sensing and Spectroscopy
Gerard D. O'Sullivan; Brian D. MacCraith; Hugh James Byrne; Enda McGlynn; Alan G. Ryder, Editor(s)

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